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Scanning Electron Microscopy and X-ray Microanalysis

 
Scanning Electron Microscopy and X-ray Microanalysis
   Author: Joseph I. Goldstein, Dale E. Newbury, D.C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
By Kluwer Academic / Plenum Publishers

List Price: £49.99
Our Price: £43.57

more information about Scanning Electron Microscopy and X-ray Microanalysis
Editorial Review
Synopsis
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A data base of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.
Related Items of Scanning Electron Microscopy and X-ray Microanalysis
Product Information
Binding: Hardcover
Dewey Decimal Number: 502.825
EAN: 9780306472923
ISBN: 0306472929
Label: Kluwer Academic / Plenum Publishers
Manufacturer: Kluwer Academic / Plenum Publishers
Number Of Items: 1
Number Of Pages: 689
Publication Date: 2002-09-01
Publisher: Kluwer Academic / Plenum Publishers
Studio: Kluwer Academic / Plenum Publishers
more information about Scanning Electron Microscopy and X-ray Microanalysis
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